A scanning electron microscope (SEM) uses a very narrow electron beam to scan the sample, producing various effects through the interaction between the electron beam and the sample. The principle involves using secondary electron signals to image and observe the surface morphology of the sample. SEM is commonly used to examine the three-dimensional structures of material surfaces and cross-sections.
Application Areas:Scanning electron microscopes (SEM) are widely used in various fields, including physics, chemistry, materials science, and biology. They are primarily employed for the observation, analysis, and testing of surface morphology and microstructures.